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ref: Lee-2005.12 tags: micromotion silicon michigan array simulation strain date: 01-28-2013 03:13 gmt revision:1 [0] [head]

PMID-16317231[0] Biomechanical analysis of silicon microelectrode-induced strain in the brain.

  • Simulation.
  • Our analysis demonstrates that when physical coupling between the electrode and the brain increases, the micromotion-induced strain of tissue around the electrode decreases as does the relative slip between the electrode and the brain.
  • Argue that micromotion and shear cause lost recording sensitivity due to inflammation and astroglial scarring around the electrode.
    • This seems to be the scientific consensus ATM.

____References____

[0] Lee H, Bellamkonda RV, Sun W, Levenston ME, Biomechanical analysis of silicon microelectrode-induced strain in the brain.J Neural Eng 2:4, 81-9 (2005 Dec)